Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate

Omar Vázquez-Estrada; Gesuri Morales-Luna; Alipio Calles-Martínez; Alejandro Reyes-Coronado; Augusto García-Valenzuela

doi:10.1117/12.2186863

20 August 2015 Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate

Omar Vázquez-Estrada, Gesuri Morales-Luna, Alipio Calles-Martínez, Alejandro Reyes-Coronado, Augusto García-Valenzuela

Author Affiliations +

Proceedings Volume 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII; 95561H (2015) https://doi.org/10.1117/12.2186863
Event: SPIE Nanoscience + Engineering, 2015, San Diego, California, United States

Abstract

In this work we study the sensitivity and detection limits of optical reflectivity measurements to inspect the deposition of metallic nanoparticles on a at surface. We use a theoretical model for the coherent reflectance of a disordered monolayer of particles to calculate the reflectivity of an air-glass interface with silver and gold nanoparticles deposited randomly on it as a function of the angle of incidence and wavelength of light. Assuming reasonable noise scenarios, we estimate the minimum detectable surface coverage fractions by the nanoparticles.

Citation Download Citation

Omar Vázquez-Estrada, Gesuri Morales-Luna, Alipio Calles-Martínez, Alejandro Reyes-Coronado, and Augusto García-Valenzuela "Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate", Proc. SPIE 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII, 95561H (20 August 2015); https://doi.org/10.1117/12.2186863

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