Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)

Alexander Jesacher; Monika Ritsch-Marte; Rafael Piestun

doi:10.1117/12.2190639

5 October 2015 Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)

Alexander Jesacher, Monika Ritsch-Marte, Rafael Piestun

Author Affiliations +

Proceedings Volume 9554, Nanoimaging and Nanospectroscopy III; 95540S (2015) https://doi.org/10.1117/12.2190639
Event: SPIE Nanoscience + Engineering, 2015, San Diego, California, United States

Abstract

Recently we introduced RESCH microscopy [1] - a scanning microscope that allows slightly refocusing the sample after the acquisition has been performed, solely by performing appropriate data post-processing. The microscope features a double-helix phase-engineered emission point spread function in combination with camera-based detection. Based on the principle of transverse resolution enhancement in Image Scanning Microscopy [2,3], we demonstrate similar resolution improvement in RESCH. Furthermore, we outline a pathway for how the collected 3D sample information can be used to construct sharper optical sections. [1] A. Jesacher, M. Ritsch-Marte and R. Piestun, accepted for Optica. [2] C.J.R. Sheppard, “Super-resolution in Confocal imaging,” Optik, 80, 53-54 (1988). [3] C.B. Müller and J. Enderlein "Image Scanning Microscopy," Phys. Rev. Lett. 104, 198101 (2010).

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Alexander Jesacher, Monika Ritsch-Marte, and Rafael Piestun "Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)", Proc. SPIE 9554, Nanoimaging and Nanospectroscopy III, 95540S (5 October 2015); https://doi.org/10.1117/12.2190639

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KEYWORDS

Microscopes

Microscopy

Resolution enhancement technologies

Image enhancement

Image resolution

Optical resolution

Cameras

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