Ramification algorithm for graphene sample-defect localization

Andre Sokolnikov

doi:10.1117/12.2180380

28 May 2015 Ramification algorithm for graphene sample-defect localization

Andre Sokolnikov

Proceedings Volume 9476, Automatic Target Recognition XXV; 947611 (2015) https://doi.org/10.1117/12.2180380
Event: SPIE Defense + Security, 2015, Baltimore, MD, United States

Abstract

Recent development of a new 2D material graphene necessitates sample characterization (in particular localization and distribution of defects). The presence of defects is unavoidable, however, it is possible to determine and predict defect distribution in graphene samples prior to the actual device making. A ramification algorithm is used for the above purpose.

Citation Download Citation

Andre Sokolnikov "Ramification algorithm for graphene sample-defect localization", Proc. SPIE 9476, Automatic Target Recognition XXV, 947611 (28 May 2015); https://doi.org/10.1117/12.2180380

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