Paper
19 February 2015 The influence of the tip shape on the STM scans
Guangxi Zhou, Mengqi Tian, Miao Song
Author Affiliations +
Proceedings Volume 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014); 94492X (2015) https://doi.org/10.1117/12.2075995
Event: The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014), 2014, Xi'an, China
Abstract
Four different shapes of probe tips are employed to perform scanning experiments on highly ordered pyrolytic graphite samples. I-Z curves and I-V curves for the tunnel current on the surface are obtained and, in the meantime, the influences of tip shape on the height scanning image are analyzed. The results show that tip shape differences have remarkable influences on the sharpness of probe tip, the resolution of the height scanning images increases with the sharpness of probe tip. The requirement for ladder scan level is much lower than that for the atom scan level. Different shapes of probe tips have little effects on the I-V curves for ladder scan. Accordingly, probe tips with only two cuts, which are suitable for ladder scan, can be obtained easily and accurately
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Guangxi Zhou, Mengqi Tian, and Miao Song "The influence of the tip shape on the STM scans", Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94492X (19 February 2015); https://doi.org/10.1117/12.2075995
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KEYWORDS
Scanning tunneling microscopy

Chemical species

3D image processing

Image analysis

Image resolution

Shape analysis

Control systems

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