Paper
12 March 2015 Spectral x-ray diffraction using a 6 megapixel photon counting array detector
Ryan D. Muir, Nicholas R. Pogranichniy, J. Lewis Muir, Shane Z. Sullivan, Kevin Battaile, Anne M. Mulichak, Scott J. Toth, Lisa J. Keefe, Garth J. Simpson
Author Affiliations +
Proceedings Volume 9401, Computational Imaging XIII; 940109 (2015) https://doi.org/10.1117/12.2079548
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
Abstract
Pixel-array array detectors allow single-photon counting to be performed on a massively parallel scale, with several million counting circuits and detectors in the array. Because the number of photoelectrons produced at the detector surface depends on the photon energy, these detectors offer the possibility of spectral imaging. In this work, a statistical model of the instrument response is used to calibrate the detector on a per-pixel basis. In turn, the calibrated sensor was used to perform separation of dual-energy diffraction measurements into two monochromatic images. Targeting applications include multi-wavelength diffraction to aid in protein structure determination and X-ray diffraction imaging.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan D. Muir, Nicholas R. Pogranichniy, J. Lewis Muir, Shane Z. Sullivan, Kevin Battaile, Anne M. Mulichak, Scott J. Toth, Lisa J. Keefe, and Garth J. Simpson "Spectral x-ray diffraction using a 6 megapixel photon counting array detector", Proc. SPIE 9401, Computational Imaging XIII, 940109 (12 March 2015); https://doi.org/10.1117/12.2079548
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KEYWORDS
Sensors

X-rays

Diffraction

X-ray diffraction

Detector arrays

X-ray imaging

Photon counting

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