Paper
27 February 2015 Epsilon near zero metamaterials for ultra-low power nonlinear applications
Monika Pietrzyk, Rishad Kaipurath, Daniele Faccio, Andrea Di Falco
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Abstract
Epsilon-near-zero metamaterial samples, composed of five alternating bi-layers of silica and silver, are fabricated using the electron-beam evaporator. Nonlinear properties of samples are measured using a pulsed Ti:sapphire laser by the z-scan technique. It is observed that the real part of the nonlinear Kerr index is one order of magnitude higher than the values expected from a naive averaging of the corresponding coefficients of metal and dielectric layers (the correct averaging should be performed with respect to the nonlinear susceptibility), so that its value is actually of the same order of magnitude as that of a single silver layer. At the same time, the transmission of our samples is remarkably higher than that of a single silver layer of the same thickness. These characteristics have a great impact on the amount of optical energy which can be pumped into the structure, thus allowing its nonlinear properties to be accumulated over long propagation distance along the sample. This property is very promising for applications, which are based on the modulation of phase, amplitude or frequency of light, especially those which require low-power operations, such as all-optical switching and memory elements.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Monika Pietrzyk, Rishad Kaipurath, Daniele Faccio, and Andrea Di Falco "Epsilon near zero metamaterials for ultra-low power nonlinear applications", Proc. SPIE 9371, Photonic and Phononic Properties of Engineered Nanostructures V, 93710Y (27 February 2015); https://doi.org/10.1117/12.2078884
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KEYWORDS
Metamaterials

Silver

Absorption

Dielectrics

Metals

Refractive index

Nonlinear optics

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