Evaluation of 1/f noise in prospective IR imaging thin films

Hitesh A. Basantani; David B. Saint John; Nikolas J. Podraza; Thomas N. Jackson; Mark W. Horn

doi:10.1117/12.2054652

24 June 2014 Evaluation of 1/f noise in prospective IR imaging thin films

Hitesh A. Basantani, David B. Saint John, Nikolas J. Podraza, Thomas N. Jackson, Mark W. Horn

Proceedings Volume 9070, Infrared Technology and Applications XL; 90701P (2014) https://doi.org/10.1117/12.2054652
Event: SPIE Defense + Security, 2014, Baltimore, MD, United States

Abstract

Vanadium oxide (VO_x) and hydrogenated silicon germanium (Si_xGe_1-x) are the two predominant thin film material systems used as the active layer in resistive infrared imaging. Thin films of VOx used in microbolometers have a resistivity typically between 0.1 and 1 Ω-cm with a temperature coefficient of resistance, |TCR| between 1.4%/K to 2.4%/K, while Si_xGe_1-x:H thin films have a resistivity between 200-4,000 Ω-cm with a |TCR| between 2.9%/K to 3.9%/K. Future devices may require higher TCR materials, however, higher TCR is loosely associated with higher resistivity and therefore also with high noise. This work compares 1/f noise of high resistivity VO_xand Ge:H thin films having |TCR| < 3.6%/K. The high TCR thin films of VO_xwere found to be amorphous while, depending on the deposition conditions, the Ge:H thin films were either amorphous or mixed phase of amorphous + nanocrystalline. Evaluation of these VO_x and Ge:H thin films indicates a prospects for a superior process-property relation of 1/f noise in Ge:H thin films in comparison with thin films of VO_x.

Citation Download Citation

Hitesh A. Basantani, David B. Saint John, Nikolas J. Podraza, Thomas N. Jackson, and Mark W. Horn "Evaluation of 1/f noise in prospective IR imaging thin films", Proc. SPIE 9070, Infrared Technology and Applications XL, 90701P (24 June 2014); https://doi.org/10.1117/12.2054652

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available