Surface defect inspection for power inductor

Chun-Li Chang; Wen-Hong Wu; Chun-Jen Chen; Hung-Ji Huang

doi:10.1117/12.2019346

22 June 2013 Surface defect inspection for power inductor

Chun-Li Chang, Wen-Hong Wu, Chun-Jen Chen, Hung-Ji Huang

Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87693F (2013) https://doi.org/10.1117/12.2019346
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore

Abstract

The core of the power inductor is made by powder metallurgy. By its nature, the powder-formed part has inherent nonuniform porosity pattern and parallel tool marks on the metal surface. In the past, the surface inspection of core is usually performed by using human eyes. However, the larger uncertainty of inspection will be induced while observing the defect image using human eyes. In the automated optical inspection process, the feature of defect is not easily separated from the image background by using the simple binarization method. This study develops an image processing method and employs a uniform diffuse illumination to build up a surface defect inspection system. Experiment result shows the distinguish rate is 95.5%, therefore it is clear that this system can successfully detects a set defect of the core of inductor.

Citation Download Citation

Chun-Li Chang, Wen-Hong Wu, Chun-Jen Chen, and Hung-Ji Huang "Surface defect inspection for power inductor", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87693F (22 June 2013); https://doi.org/10.1117/12.2019346

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KEYWORDS

Image filtering

Image processing

Inspection

Gaussian filters

Defect inspection

Fourier transforms

Linear filtering

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