Paper
31 January 2013 2eVME VME64x slave module design
Wei Du, Cong Li, Xinglin Chen, Yang Liu
Author Affiliations +
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 875936 (2013) https://doi.org/10.1117/12.2018755
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
Twenty-one cards access VME64x IPC in the wafer stage control system. So many dedicated boards share one bus lead to increased latency data transmission on the bus. This article uses a low-cost bus upgrade logic module to improve the data transmission capacity of the bus. This module use the 2eVME protocol which VME64x protocol support. The logical interface designed introduced in detail in this paper. Also a simulation experiment is conducted. The simulation results are consistent with the theory. Transferring large amounts of data, the speed of the bus protocol can reach 2 times the ordinary VME protocol speed.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Du, Cong Li, Xinglin Chen, and Yang Liu "2eVME VME64x slave module design", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875936 (31 January 2013); https://doi.org/10.1117/12.2018755
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KEYWORDS
Logic

Data modeling

Data transmission

Control systems

Semiconducting wafers

Control systems design

Interfaces

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