Paper
16 May 2013 Active matrix organic light emitting diode (AMOLED) performance and life test results
David A. Fellowes, Michael E. Botkin, Russell S. Draper, Jason Coletta
Author Affiliations +
Abstract
The U.S. Army and eMagin Corporation established a Cooperative Research and Development Agreement (CRADA) to characterize the ongoing improvements in the lifetime of OLED displays. This CRADA also called for the evaluation of OLED performance as the need arises, especially when new products are developed or when a previously untested parameter needs to be understood. In 2006, eMagin Corporation developed long-life OLED-XL devices for use in their AMOLED microdisplays for head-worn applications. Through Research and Development programs from 2007 to 2012 with the U.S. Government, eMagin made additional improvements in OLED life and developed the first SXGA (1280 X 1024 with triad pixels) and WUXGA (1920 X 1200 with triad pixels) OLED microdisplays. US Army RDECOM CERDEC NVESD conducted life and performance tests on these displays, publishing results at the 2012, 2011, 2010, 2009, 2008, and 2007 SPIE Defense, Security and Sensing Symposia. Life and performance tests have continued through 2013, and this data will be presented along with a comparison to previous data. This should result in a better understanding of the applicability of AMOLEDs in military and commercial head mounted systems, where good fits are made, and where further development might be desirable.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David A. Fellowes, Michael E. Botkin, Russell S. Draper, and Jason Coletta "Active matrix organic light emitting diode (AMOLED) performance and life test results", Proc. SPIE 8735, Head- and Helmet-Mounted Displays XVIII: Design and Applications, 873505 (16 May 2013); https://doi.org/10.1117/12.2014596
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Cited by 1 scholarly publication.
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KEYWORDS
Organic light emitting diodes

Video

Calibration

Image quality

Defense and security

Manufacturing

Photometry

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