Wavelet-based figure of merit for macro-uniformity

Xing Liu; Gary Overall; Travis Riggs; Rebecca Silveston-Keith; Julie Whitney; George Chiu; Jan Allebach

doi:10.1117/12.2008515

4 February 2013 Wavelet-based figure of merit for macro-uniformity

Xing Liu, Gary Overall, Travis Riggs, Rebecca Silveston-Keith, Julie Whitney, George Chiu, Jan Allebach

Proceedings Volume 8653, Image Quality and System Performance X; 86530Q (2013) https://doi.org/10.1117/12.2008515
Event: IS&T/SPIE Electronic Imaging, 2013, Burlingame, California, United States

Abstract

Wavelets are a powerful tool that can be applied to problems in image processing and analysis. They provide a multi-scale decomposition of an original image into average terms and detail terms that capture the characteristics of the image at different scales. In this project, we develop a figure of merit for macro-uniformity that is based on wavelets. We use the Haar basis to decompose the image of the scanned page into eleven levels. Starting from the lowest frequency level, we group the eleven levels into three non-overlapping separate frequency bands, each containing three levels. Each frequency band image consists of the superposition of the detail images within that band. We next compute 1-D horizontal and vertical projections for each frequency band image. For each frequency band image projection, we develop a structural approximation that summarizes the essential visual characteristics of that projection. For the coarsest band comprising levels 9,10,11, we use a generalized square-wave approximation. For the next coarsest band comprising levels 6,7,8, we use a piecewise linear spline approximation. For the finest bands comprising levels 3,4,5, we use a spectral decomposition. For each 1-D approximation signal, we define an appropriate set of scalar-valued features. These features are used to design two predictors one based on linear regression and the other based on the support vector machine, which are trained with data from our image quality ruler experiments with human subjects.

Citation Download Citation

Xing Liu, Gary Overall, Travis Riggs, Rebecca Silveston-Keith, Julie Whitney, George Chiu, and Jan Allebach "Wavelet-based figure of merit for macro-uniformity", Proc. SPIE 8653, Image Quality and System Performance X, 86530Q (4 February 2013); https://doi.org/10.1117/12.2008515

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available