An all-optical protocol to determine the molecular origin of radiation damage/enhancement in electro-optic polymeric materials

Javier Pérez-Moreno; Stijn Van Cleuvenbergen; Maarten Vanbel; Koen Clays; Edward W. Taylor

doi:10.1117/12.929297

15 October 2012 An all-optical protocol to determine the molecular origin of radiation damage/enhancement in electro-optic polymeric materials

Javier Pérez-Moreno, Stijn Van Cleuvenbergen, Maarten Vanbel, Koen Clays, Edward W. Taylor

Author Affiliations +

Proceedings Volume 8519, Nanophotonics and Macrophotonics for Space Environments VI; 85190C (2012) https://doi.org/10.1117/12.929297
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Previous studies on the radiation effects upon polymer and polymer-based photonic materials suggest that the radiation resistance of the material is heavily dependent on the choice of polymer-host and guest-chromophore. To date, the best results have been achieved with electro optic polymeric materials based on CLD1 doped in APC, which has resulted in improved performance at the device level upon gamma-ray irradiation at moderate doses. However, the physical mechanisms are yet not fully understood. In this paper, we introduce an all-optical (linear and nonlinear) characterization protocol that is aimed to elucidate the mechanisms of the radiation damage/enhancement of electro-optic polymeric materials. This protocol is used to quantify the damage/enhancement effects upon irradiation in terms of the relevant physical parameters on a collection of electro-optic polymeric thin film samples.

Citation Download Citation

Javier Pérez-Moreno, Stijn Van Cleuvenbergen, Maarten Vanbel, Koen Clays, and Edward W. Taylor "An all-optical protocol to determine the molecular origin of radiation damage/enhancement in electro-optic polymeric materials", Proc. SPIE 8519, Nanophotonics and Macrophotonics for Space Environments VI, 85190C (15 October 2012); https://doi.org/10.1117/12.929297

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