Properties of Photon Sieve Diffraction Based on FDTD Method

Yu He; Lixin Zhao; Song Hu; Mingyong Chen; Yan Tang

doi:10.1117/12.971466

15 October 2012 Properties of photon sieve diffraction based on FDTD method

Yu He, Lixin Zhao, Song Hu, Mingyong Chen, Yan Tang

Proceedings Volume 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems; 84180A (2012) https://doi.org/10.1117/12.971466
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Photon sieve is a new nano-scale imaging aperture. When the diameter of pinholes of photon sieve is less than the wavelength of incident light, scaler diffraction theory is no longer valid for this condition. So vector theory must be used. The finite difference time domain (FDTD) is an effectual tool of numerical calculation and analysis of light field. We put forward researching high NA photon sieve with FDTD method. First we analyze the imaging properties of a single pinhole of photon sieve with vector diffraction theory and then introduce the principle and realization of FDTD. At last FDTD method is used to the numerical simulation of a pinhole. The simulation results are aslo compared to the results using scaler diffraction theory. It shows that scaler diffraction theory is not valid. The necessity and feasibility of using FDTD method to analyze and design high NA photon sieve is proved.

Citation Download Citation

Yu He, Lixin Zhao, Song Hu, Mingyong Chen, and Yan Tang "Properties of photon sieve diffraction based on FDTD method", Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84180A (15 October 2012); https://doi.org/10.1117/12.971466

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