A new high-resolution, high-throughput spectrometer: first experience as applied to Raman spectroscopy

Jeffrey T. Meade; Bradford B. Behr; Arsen R. Hajian

doi:10.1117/12.919062

17 May 2012 A new high-resolution, high-throughput spectrometer: first experience as applied to Raman spectroscopy

Jeffrey T. Meade, Bradford B. Behr, Arsen R. Hajian

Proceedings Volume 8374, Next-Generation Spectroscopic Technologies V; 83740V (2012) https://doi.org/10.1117/12.919062
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

The classic trade-off between resolution and throughput in a dispersive spectrometer is overcome using virtual slit technology. An optimized spectrometer designed from the ground up to incorporate a virtual slit is experimentally demonstrated by Raman experiments.

Citation Download Citation

Jeffrey T. Meade, Bradford B. Behr, and Arsen R. Hajian "A new high-resolution, high-throughput spectrometer: first experience as applied to Raman spectroscopy", Proc. SPIE 8374, Next-Generation Spectroscopic Technologies V, 83740V (17 May 2012); https://doi.org/10.1117/12.919062

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