High-speed resonant FTIR spectrometer

Julia Rentz Dupuis; David Carlson; David J. Mansur; Scott P. Newbry; Robert Vaillancourt; James R. Engel; Bradley Engel

doi:10.1117/12.917319

17 May 2012 High-speed resonant FTIR spectrometer

Julia Rentz Dupuis, David Carlson, David J. Mansur, Scott P. Newbry, Robert Vaillancourt, James R. Engel, Bradley Engel

Proceedings Volume 8374, Next-Generation Spectroscopic Technologies V; 83740U (2012) https://doi.org/10.1117/12.917319
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

OPTRA is in the process of completing the development of a high speed resonant Fourier transform infrared (HSR-FTIR) spectrometer in support of the Army's thermal luminescence measurements of contaminants on surfaces. Our system employs a resonant scanning mirror which enables 6.2 kHz spectral acquisition rate with 27 cm^-1 spectral resolution over the 700 to 1400 cm^-1 spectral range. The design is ultimately projected to achieve a 10 kHz spectral acquisition rate with 8 cm^-1 spectral resolution over the same spectral range. To date this system represents the highest/broadest combination of spectral acquisition rate and spectral range available. Our paper reports on the final design, build, and test of the HSR-FTIR prototype spectrometer system. We present a final radiometric analysis predicting system performance along with the details of the signal channel conditioning which addresses the effects of the high speed sinusoidal scanning. We present the final opto-mechanical design and the high speed interferogram acquisition scheme. We detail the system build and integration and describe the tests that will be performed to characterize the instrument. Finally, we offer a list of future improvements of the HSR-FTIR system.

Citation Download Citation

Julia Rentz Dupuis, David Carlson, David J. Mansur, Scott P. Newbry, Robert Vaillancourt, James R. Engel, and Bradley Engel "High-speed resonant FTIR spectrometer", Proc. SPIE 8374, Next-Generation Spectroscopic Technologies V, 83740U (17 May 2012); https://doi.org/10.1117/12.917319

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KEYWORDS

Mirrors

Signal to noise ratio

Interferometers

Sensors

Prototyping

Spectroscopy

Spectral resolution

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