Mueller matrix of a dicot leaf

Vern C. Vanderbilt; Craig S. T. Daughtry

doi:10.1117/12.919480

8 June 2012 Mueller matrix of a dicot leaf

Vern C. Vanderbilt, Craig S. T. Daughtry

Proceedings Volume 8364, Polarization: Measurement, Analysis, and Remote Sensing X; 83640R (2012) https://doi.org/10.1117/12.919480
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

A better understanding of the information contained in the spectral, polarized bidirectional reflectance and transmittance of leaves may lead to improved techniques for identifying plant species in remotely sensed imagery as well as better estimates of plant moisture and nutritional status. Here we report an investigation of the optical polarizing properties of several leaves of one species, Cannabis sativa, represented by a 3x3 Mueller matrix measured over the wavelength region 400-2,400 nm. Our results support the hypothesis that the leaf surface alters the polarization of incident light - polarizing off nadir, unpolarized incident light, for example - while the leaf volume tends to depolarized incident polarized light.

Citation Download Citation

Vern C. Vanderbilt and Craig S. T. Daughtry "Mueller matrix of a dicot leaf", Proc. SPIE 8364, Polarization: Measurement, Analysis, and Remote Sensing X, 83640R (8 June 2012); https://doi.org/10.1117/12.919480

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