Paper
15 November 2011 Semi-automatic inspecting instrument for watch escape wheel based on machine vision
Zhong Wang, Zhen-wei Wang, Jin Zhang, Zhen-xing Cai, Xin-bo Liu
Author Affiliations +
Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 83210Q (2011) https://doi.org/10.1117/12.903846
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
Escape wheel as a typical precision micro-machinery part is one of the most precision parts in one mechanical watch. A new inspecting instrument based on machine vision technology used to achieve semi-automatic inspection of watch escape wheel is introduced in this paper. This instrument makes use of high resolution CCD sensor and independent designed lens as the imaging system. It can not only achieve to image an area with 7mm diameter once, but also has the resolving power in micrometer and cooperates with two-dimensional moving station to achieve a continuous and automatic measurement of the work pieces placed in array type. In which, the following aspects are highlighted: measuring princeple and process, the basic components of array type measuring workbench, positioning process and verticality, parallelism and other precision adjusting mechanism. Cooperating with novelty escape wheel preparation tool this instrument forms an array type semi-automatic measuring mode. At present, the instrument has been successfully running in the industry field.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhong Wang, Zhen-wei Wang, Jin Zhang, Zhen-xing Cai, and Xin-bo Liu "Semi-automatic inspecting instrument for watch escape wheel based on machine vision", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210Q (15 November 2011); https://doi.org/10.1117/12.903846
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Cited by 2 scholarly publications.
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KEYWORDS
Image processing

Imaging systems

Inspection

Control systems

CCD cameras

Lens design

Machine vision

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