Paper
2 February 2012 Robust recognition of 1D barcodes using Hough transform
John Dwinell, Peng Bian, Long Xiang Bian
Author Affiliations +
Proceedings Volume 8300, Image Processing: Machine Vision Applications V; 83000K (2012) https://doi.org/10.1117/12.907598
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States
Abstract
In this paper we present an algorithm for the recognition of 1D barcodes using the Hough transform, which is highly robust regarding the typical degraded image. The algorithm addresses various typical image distortions, such as inhomogeneous illumination, reflections, damaged barcode or blurriness etc. Other problems arise from recognizing low quality printing (low contrast or poor ink receptivity). Traditional approaches are unable to provide a fast solution for handling such complex and mixed noise factors. A multi-level method offers a better approach to best manage competing constraints of complex noise and fast decode. At the lowest level, images are processed in gray scale. At the middle level, the image is transformed into the Hough domain. At the top level, global results, including missing information, is processed within a global context including domain heuristics as well as OCR. The three levels work closely together by passing information up and down between levels.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Dwinell, Peng Bian, and Long Xiang Bian "Robust recognition of 1D barcodes using Hough transform", Proc. SPIE 8300, Image Processing: Machine Vision Applications V, 83000K (2 February 2012); https://doi.org/10.1117/12.907598
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Hough transforms

Image processing

Optical character recognition

Evolutionary algorithms

Detection and tracking algorithms

Intelligence systems

Artificial intelligence

Back to Top