A reflection-mode configuration for enhanced light delivery through turbidity

Timothy R. Hillman; Youngwoon Choi; Niyom Lue; Yongjin Sung; Ramachandra R. Dasari; Wonshik Choi; Zahid Yaqoob

doi:10.1117/12.909735

10 February 2012 A reflection-mode configuration for enhanced light delivery through turbidity

Timothy R. Hillman, Youngwoon Choi, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Wonshik Choi, Zahid Yaqoob

Proceedings Volume 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX; 82271T (2012) https://doi.org/10.1117/12.909735
Event: SPIE BiOS, 2012, San Francisco, California, United States

Abstract

We propose a method based on wavefront shaping for enhancing the backscattered light detected from any location in a sample medium, using low-coherence interferometry. The lateral phase profile of the light incident upon the sample is controlled using a spatial light modulator (SLM). In this manner, we apply an orthogonal set of phase masks to the illumination (input) and measure the backscattered signal response (output). These measurements permit us to determine the linear transformation between the input complex-amplitude modulation profile and the output time-resolved signal. Thus, we can determine the appropriate SLM write pattern for maximizing the detected signal for a given optical time delay (in the sample arm). In this manuscript, we are interested in the degree to which maximizing this signal also permits us to localize the three-dimensional sample region from which the backscattered signal is derived.

Citation Download Citation

Timothy R. Hillman, Youngwoon Choi, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Wonshik Choi, and Zahid Yaqoob "A reflection-mode configuration for enhanced light delivery through turbidity", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271T (10 February 2012); https://doi.org/10.1117/12.909735

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