Self-referenced quantitative phase microscopy

Timothy R. Hillman; Niyom Lue; Yongjin Sung; Ramachandra R. Dasari; Peter T. C. So; Zahid Yaqoob

doi:10.1117/12.909701

10 February 2012 Self-referenced quantitative phase microscopy

Timothy R. Hillman, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, Zahid Yaqoob

Proceedings Volume 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX; 82271S (2012) https://doi.org/10.1117/12.909701
Event: SPIE BiOS, 2012, San Francisco, California, United States

Abstract

Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.

Citation Download Citation

Timothy R. Hillman, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, and Zahid Yaqoob "Self-referenced quantitative phase microscopy", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271S (10 February 2012); https://doi.org/10.1117/12.909701

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