Star test polarimetry using stress-engineered optical elements

Roshita Ramkhalawon; Amber M. Beckley; Thomas G. Brown

doi:10.1117/12.908472

2 February 2012 Star test polarimetry using stress-engineered optical elements

Roshita Ramkhalawon, Amber M. Beckley, Thomas G. Brown

Proceedings Volume 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX; 82270Q (2012) https://doi.org/10.1117/12.908472
Event: SPIE BiOS, 2012, San Francisco, California, United States

Abstract

Stress-engineered optical elements have potential applications in snapshot polarimetry, in which a single irradiance image is used to measure a spatially varying polarization. In this paper, we present star test polarimetry which is a method of polarization retrieval by analyzing a single frame point spread function. A trigonally stressed window placed at the pupil plane of an imaging system is used to produce point spread functions which are then processed to extract the polarization state of the incoming beam under investigation. We outline several methods which are used to recover the Stokes parameters of a beam of unknown polarization from the irradiance distribution of its point spread function.

Citation Download Citation

Roshita Ramkhalawon, Amber M. Beckley, and Thomas G. Brown "Star test polarimetry using stress-engineered optical elements", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82270Q (2 February 2012); https://doi.org/10.1117/12.908472

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