The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

Hong-ming Zhao; Jin-dong Fei; Hong Yu; Hui-jie Du; Yi Zhang

doi:10.1117/12.900596

8 September 2011 The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector

Hong-ming Zhao, Jin-dong Fei, Hong Yu, Hui-jie Du, Yi Zhang

Author Affiliations +

Proceedings Volume 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies; 81911B (2011) https://doi.org/10.1117/12.900596
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

The resistor array devices are commonly used to produce dynamic two dimensional infrared images in the infrared scene projectors. A non-uniformity caused by many factors is the main source of image fixed pattern noise of the projectors based on resistor array devices. A prior non-uniformity correction procedure must be done before the dynamic infrared image generation for the hardware-in-the-loop simulation test and evaluation. In this paper, the developments and details of the non-uniformity correction technologies for resistor array dynamic infrared scene projector are investigated. The research is commenced directed towards understanding the cause of spatially-distributed radiance non-uniformities of resistor array device, and the fundamental elements that underlie the non-uniformity correction technologies in dynamic infrared scene projection system.

Citation Download Citation

Hong-ming Zhao, Jin-dong Fei, Hong Yu, Hui-jie Du, and Yi Zhang "The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector", Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911B (8 September 2011); https://doi.org/10.1117/12.900596

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