Paper
26 October 2011 Comparative analyses of multifrequency PSI ground deformation measurements
José R. Sabater, Javier Duro, Alain Arnaud, David Albiol, Fifamè N. Koudogbo
Author Affiliations +
Proceedings Volume 8179, SAR Image Analysis, Modeling, and Techniques XI; 81790M (2011) https://doi.org/10.1117/12.898916
Event: SPIE Remote Sensing, 2011, Prague, Czech Republic
Abstract
In recent years many new developments have been made in the field of SAR image analysis. The diversity of available SAR imagery allows a wider range of applications to be covered in the domain of risk management and hazard mapping. The work that we propose is based on the analysis of differences in ground deformation measurements extracted from the processing of data stacks acquired at different frequencies. The aim of the project is the definition of criteria that could assist in the selection of the most appropriate SAR mission according to the type of regions of interest. Key factors are geographic localization and land cover. The study is organized in two main parts. First, the impact of sensitivity to motion, land cover characteristics, spatial resolution and atmospheric artifacts is investigated at different wavelengths. Second, the PS density achieved and the capacity to detect and monitor fast and slow motions over urban and rural areas with different frequencies is analyzed. The presented InSAR analyses have been performed using the Stable Point Network (SPN) PSI software developed by Altamira Information.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
José R. Sabater, Javier Duro, Alain Arnaud, David Albiol, and Fifamè N. Koudogbo "Comparative analyses of multifrequency PSI ground deformation measurements", Proc. SPIE 8179, SAR Image Analysis, Modeling, and Techniques XI, 81790M (26 October 2011); https://doi.org/10.1117/12.898916
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Cited by 4 scholarly publications.
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KEYWORDS
Picosecond phenomena

Synthetic aperture radar

L band

Interferometry

Sensors

X band

Motion measurement

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