Paper
13 October 2011 30nm full field quartz template replicated from Si master for FLASH active layer NIL
Duhyun Lee, Byung-Kyu Lee, Woong Ko, Jae-Kwan Kim, Kiyeon Yang, Byounghoon Seung, Ilyong Jang, Mun Ja Kim, Byunggook Kim, ChangMin Park, Jeongho Yeo, Changyoul Moon
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Abstract
38nm half pitch pattern was replicated from Si master pattern to quartz blank template. It is a novel approach different from typical quartz to quartz replication. This replication concept is expected to alleviate the burden not only in cost but also resolution for NIL template fabrication. In this study, full field Si master fabricated by ArF immersion lithography, UV-transparent hard mask for quartz blank template and core-out quartz blank template were applied to prove the concept. And the replica template was evaluated with NIL and subsequent etching.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Duhyun Lee, Byung-Kyu Lee, Woong Ko, Jae-Kwan Kim, Kiyeon Yang, Byounghoon Seung, Ilyong Jang, Mun Ja Kim, Byunggook Kim, ChangMin Park, Jeongho Yeo, and Changyoul Moon "30nm full field quartz template replicated from Si master for FLASH active layer NIL", Proc. SPIE 8166, Photomask Technology 2011, 81661U (13 October 2011); https://doi.org/10.1117/12.898747
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KEYWORDS
Quartz

Silicon

Etching

Nanoimprint lithography

Chromium

Oxides

Line width roughness

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