Paper
13 September 2011 Measurement and analysis of non-uniformities in CdTe solar cells
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Abstract
CdTe and other thin-film polycrystalline solar cells have potential spatial non-uniformities in their photovoltaic response that can both lower their performance and complicate the analysis of their current-voltage curves. Polycrystalline cells have inherent non-uniformities associated with their grain structure, but there are a variety of other possibilities including thickness variations, local shunts, and weak-diode areas. Additionally, there are possible issues associated with the fabrication process due to cleaning residues, scratches, thermal variations, and particulate inclusions. The primary measurements described here to map the non-uniformities of CdTe cells are light-beam-induced current (LBIC), which gives a direct measure of the local PV response, and electroluminescence (EL), which is the inverse of the PV effect. The former is attractive, because it can be used to deduce the local current-voltage curve, but data collection is time consuming. The latter though the use of modern CCD cameras takes only a few seconds and is compatible with production-line screening.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James R. Sites "Measurement and analysis of non-uniformities in CdTe solar cells", Proc. SPIE 8110, Thin Film Solar Technology III, 81100G (13 September 2011); https://doi.org/10.1117/12.893083
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KEYWORDS
Electroluminescence

Solar cells

Quantum efficiency

Cadmium sulfide

Photovoltaics

Luminescence

CCD cameras

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