Paper
24 May 2011 Full-aperture x-ray tests of Kirkpatrick-Baez modules: preliminary results
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Abstract
We report on preliminary results of full aperture X-ray optical tests at the X-ray test facility at the University of Colorado (USA) of four test modules of Kirkpatrick-Baez (KB) X-ray optical systems performed in August 2010. Direct experimental comparisons were made between gold-coated optics of two novel substrates: glass foils and silicon wafers. The preliminary results are promising, with full-width half-maxima of full stacks being of order of 30 arcsec in 2D full arrangement. These results justify further efforts to improve KB optics for use in low-cost, high-performance space-borne astronomical imaging instruments for X-ray wavelengths.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Pina, V. Marsikova, R. Hudec, A. Inneman, J. Marsik, W. Cash, A. Shipley, and B. Zeiger "Full-aperture x-ray tests of Kirkpatrick-Baez modules: preliminary results", Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 807609 (24 May 2011); https://doi.org/10.1117/12.890517
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Cited by 2 scholarly publications.
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KEYWORDS
Silicon

X-rays

X-ray optics

Glasses

X-ray astronomy

Mirrors

Wafer-level optics

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