Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8036, including the Title Page, Copyright information, Table of Contents, Introduction, and the Conference Committee listing.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8036", Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803601 (29 June 2011); https://doi.org/10.1117/12.901403
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CITATIONS
Cited by 3 patents.
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KEYWORDS
Standards development

Microscopy

Defense technologies

Scanning electron microscopy

Forensic science

Particles

Defense and security

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