Paper
20 May 2011 Moldable AR microstructures for improved laser transmission and damage resistance in CIRCM fiber optic beam delivery systems
Bruce D. MacLeod, Douglas S. Hobbs, Ernest Sabatino III
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Abstract
Anti-reflecting (AR) surface relief microstructures (ARMs) are being developed as a replacement for thin-film AR coatings in laser-based systems to improve light transmission, power handling, operational bandwidth, and system reliability. Because ARMs textures have the potential to be replicated using simple embossing methods, the performance advantage and robustness of ARMs can be extended to moldable mid-infrared transmitting materials such as chalcogenide optical fibers. In this work, the optical performance of mid-infrared transparencies incorporating ARMs textures replicated from a master template has been modeled, and multiple master stamping tools have been fabricated in materials such as diamond, silicon carbide, nickel, silicon, and sapphire. Images from ARMs texture embossing trials using arsenic sulfide and arsenic selenide (AMTIR2) glasses, and fluoride glasses such as ZBLAN and indium fluoride provided by IRPhotonics, show excellent pattern transfer and fidelity. Transmission measurements of ARMs textures stamped into arsenic sulfide and arsenic selenide windows show broadband infrared performance equivalent to ARMs textured windows processed by direct patterning and etch methods. A system for molding ARMs textures directly into the end facets of multi-mode mid-infrared transmitting fibers is yielding promising initial results.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce D. MacLeod, Douglas S. Hobbs, and Ernest Sabatino III "Moldable AR microstructures for improved laser transmission and damage resistance in CIRCM fiber optic beam delivery systems", Proc. SPIE 8016, Window and Dome Technologies and Materials XII, 80160Q (20 May 2011); https://doi.org/10.1117/12.883281
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Cited by 9 scholarly publications.
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KEYWORDS
Mid-IR

Scanning electron microscopy

Silicon

Thin films

Glasses

Laser induced damage

Nickel

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