Paper
22 March 2011 High-performance intensity slope correction method for global process variability band improvement and printability enhancement in RET applications
Sergiy M. Komirenko
Author Affiliations +
Abstract
A qualitatively new method applicable for process variability band (PVband) improvement and printability enhancement in resolution enhancement technique (RET) applications is reported. The method does not use costly simulations through the process window (PW). Instead, it utilizes a unique feedback mechanism derived from the intensity distribution information available during nominal optical proximity correction (OPC) simulation. Consequently, this Intensity Slope Correction (ISC) method provides superior performance as compared to traditional process window aware OPC tools. Preliminary results are presented. They suggest that this method can successfully be applied for improvement of integral PVband throughout the entire layout leading to global printability optimization.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergiy M. Komirenko "High-performance intensity slope correction method for global process variability band improvement and printability enhancement in RET applications", Proc. SPIE 7973, Optical Microlithography XXIV, 797318 (22 March 2011); https://doi.org/10.1117/12.877594
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KEYWORDS
Optical proximity correction

Resolution enhancement technologies

Photomasks

Critical dimension metrology

Immersion lithography

Model-based design

Solids

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