Modeling and measurement of IF gain bandwidth and intrinsic noise temperature for NbTiN hot electron bolometer mixers at Terahertz frequencies

Jiang Ling; Fei Liu Yun; Satoshi Yamamoto

doi:10.1117/12.870090

4 November 2010 Modeling and measurement of IF gain bandwidth and intrinsic noise temperature for NbTiN hot electron bolometer mixers at Terahertz frequencies

Jiang Ling, Fei Liu Yun, Satoshi Yamamoto

Author Affiliations +

Proceedings Volume 7854, Infrared, Millimeter Wave, and Terahertz Technologies; 78543N (2010) https://doi.org/10.1117/12.870090
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

In this paper, we present the modeling and measurement results of niobium titanium nitride hot electron bolometer mixers with different sizes at terahertz frequencies. A distributed hot spot model which is based on solving a heat balance equation is employed to characterize current-voltage curve, electron and phonon temperature distribution along superconducting microbridge, intermediate frequency gain bandwidth and intrinsic noise temperature of the mixers. The simulated intermediate frequency gain bandwidth decreases with the increase of microbridge length, which is in good agreement with measured results. A difference of factor of several tens exists between the calculated and measured mixer noise temperature, which is probably due to the disfigurement of waveguide structure and unknown noise from the mixer.

Citation Download Citation

Jiang Ling, Fei Liu Yun, and Satoshi Yamamoto "Modeling and measurement of IF gain bandwidth and intrinsic noise temperature for NbTiN hot electron bolometer mixers at Terahertz frequencies", Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78543N (4 November 2010); https://doi.org/10.1117/12.870090

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