Analysis of the characteristic of optical communication system influenced by first-order polarization mode dispersion

Feng Wang; Kuan Wang; Hong-lei Jiao; Xiu-hong Chen; Hui Cheng; Li-zhen Feng

doi:10.1117/12.867459

20 August 2010 Analysis of the characteristic of optical communication system influenced by first-order polarization mode dispersion

Feng Wang, Kuan Wang, Hong-lei Jiao, Xiu-hong Chen, Hui Cheng, Li-zhen Feng

Author Affiliations +

Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 78203B (2010) https://doi.org/10.1117/12.867459
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China

Abstract

When attenuation and chromatic dispersion are compensated for, polarization mode dispersion (PMD) is a major limitation to the transmission capabilities of optical communication systems. So it is necessary to study PMD. In the paper, we simulated first-order PMD statistical properties, the relationship of Mean DGD and transmission distance, the deterioration of the receiver pulse broadening induced by PMD on pulse broadening theory, the distance relay L limited by system transmission speed B under different PMD, several systems of different PMD restrict the transmission distance etc., come to conclusion that PMD have some restrictions on high-speed system design. And the higher the rate, the shorter the distance relay. For low-speed system, by choosing low values of fiber PMD can increase distance relay, but for high-speed system, it is not a good idea to improve the system by selecting the optical fiber. In the actual design, you should consider PMD index of optical fiber, chosen code pattern of the system, transmission rate and error rate etc.

Citation Download Citation

Feng Wang, Kuan Wang, Hong-lei Jiao, Xiu-hong Chen, Hui Cheng, and Li-zhen Feng "Analysis of the characteristic of optical communication system influenced by first-order polarization mode dispersion", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78203B (20 August 2010); https://doi.org/10.1117/12.867459

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