Developing a multispectral HDR imaging module for a BRDF measurement system

Duck Bong Kim; Myoung Kook Seo; Kang Yeon Kim; Kwan H. Lee

doi:10.1117/12.860071

1 September 2010 Developing a multispectral HDR imaging module for a BRDF measurement system

Duck Bong Kim, Myoung Kook Seo, Kang Yeon Kim, Kwan H. Lee

Proceedings Volume 7792, Reflection, Scattering, and Diffraction from Surfaces II; 77920M (2010) https://doi.org/10.1117/12.860071
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Most recent bidirectional reflectance distribution function (BRDF) measurement systems are the image-based that consist of a light source, a detector, and curved samples. They are useful for measuring the reflectance properties of a material but they have two major drawbacks. They suffer from high cost of BRDF acquisition and also give inaccurate results due to the limited use of spectral bands. In this paper, we propose a novel multispectral HDR imaging system and its efficient characterization method. It combines two promising technologies: high dynamic range (HDR) imaging and multispectral imaging to measure BRDF. We perform a full spectral recovery using camera response curves for each wavelength band and its analysis. For this, we use an HDR camera to capture HDR images and a liquid crystal tunable filter (LCTF) to generate multi-spectral images. Our method can provide an accurate color reproduction of metameric objects as well as a saturated image. Our multi-spectral HDR imaging system provides a very fast data acquisition time and also gives a low system setup cost compared to previous multi-spectral imaging systems and point-based commercial spectroradiometers. We verify the color accuracy of our multi-spectral HDR imaging system in terms of human vision and metamerism using colorimetric and spectral metric.

Citation Download Citation

Duck Bong Kim, Myoung Kook Seo, Kang Yeon Kim, and Kwan H. Lee "Developing a multispectral HDR imaging module for a BRDF measurement system", Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 77920M (1 September 2010); https://doi.org/10.1117/12.860071

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