Surface-enhanced Raman scattering characterization of Ag nanorod arrays fabricated by oblique angle deposition

Yongjun Liu; Yiping Zhao

doi:10.1117/12.859924

10 September 2010 Surface-enhanced Raman scattering characterization of Ag nanorod arrays fabricated by oblique angle deposition

Yongjun Liu, Yiping Zhao

Author Affiliations +

Proceedings Volume 7757, Plasmonics: Metallic Nanostructures and Their Optical Properties VIII; 77570Q (2010) https://doi.org/10.1117/12.859924
Event: SPIE NanoScience + Engineering, 2010, San Diego, California, United States

Abstract

Silver nanorod arrays with different lengths fabricated by oblique angle deposition at various vapor deposition angles have been studied systematically by surface-enhanced Raman scattering (SERS). The SERS response of those substrates strongly depends on the length of the nanorods and the deposition angle, and the highest SERS enhancement factor can reach close to 10⁹. The reflections of the support substrate where the Ag nanorods are grown directly affect the SERS enhancement. In addition, the SERS response strongly depends on the incident configuration of the excitation beam, such as polarization and incident angle. We also find that the probe molecules on the side surface of nanorods contribute the most to the SERS intensity. This is due to the anisotropic optical properties of nanorods and the thickness of the nanorods. This study demonstrates that the Ag nanorod arrays are highly sensitive, uniform, and stable SERS substrates, and its SERS mechanism depends on the complex nanorod film geometry.

Citation Download Citation

Yongjun Liu and Yiping Zhao "Surface-enhanced Raman scattering characterization of Ag nanorod arrays fabricated by oblique angle deposition", Proc. SPIE 7757, Plasmonics: Metallic Nanostructures and Their Optical Properties VIII, 77570Q (10 September 2010); https://doi.org/10.1117/12.859924

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