The influence of non-uniform sampling in the IEC flicker metering

V. Kyovtorov; H. Kabakchiev; V. Behar

doi:10.1117/12.871947

14 September 2010 The influence of non-uniform sampling in the IEC flicker metering

V. Kyovtorov, H. Kabakchiev, V. Behar

Proceedings Volume 7745, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2010; 77451M (2010) https://doi.org/10.1117/12.871947
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2010, 2010, Wilga, Poland

Abstract

This paper studies the influence of non-uniform sampling on the power line flicker estimation. A digital non-uniform sampling MATLAB flickermeter model is considered. The model is fully compliant with the CEI/IEC 61000-4-15 standard and is tested within mains frequency variations 50Hz +/- 2.5Hz. The normalized flickermeter response and the flickermeter classifier are tested according to the IEC standard recommendations. The results indicate that the most sensitive point 8.8Hz is influenced within the standard error +/- 0.05 and only the last testing point exceeds the prescribed standard error.

Citation Download Citation

V. Kyovtorov, H. Kabakchiev, and V. Behar "The influence of non-uniform sampling in the IEC flicker metering", Proc. SPIE 7745, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2010, 77451M (14 September 2010); https://doi.org/10.1117/12.871947

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