X-ray resolution tests of an off-plane reflection grating for IXO

Benjamin R. Zeiger; Ann Shipley; Webster Cash; Randall McEntaffer

doi:10.1117/12.857503

30 July 2010 X-ray resolution tests of an off-plane reflection grating for IXO

Benjamin R. Zeiger, Ann Shipley, Webster Cash, Randall McEntaffer

Proceedings Volume 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray; 773245 (2010) https://doi.org/10.1117/12.857503
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States

Abstract

We describe the experimental apparatus in use to test an off-plane reflection grating for the soft x-ray (0.3-1.0 keV) bandpass. The grating is a prototype for the X-ray Grating Spectrometer on the International X-ray Observatory (IXO). It has holographically-ruled radial grooves to match the converging beam of a 6.5 m focal length telescope. Laboratory tests are ongoing, with ray tracing indicating that a resolution (ΔE/E) >3,000 is achievable across the 0.3-1.0 keV bandpass- the requirement to achieve IXO science goals.

Citation Download Citation

Benjamin R. Zeiger, Ann Shipley, Webster Cash, and Randall McEntaffer "X-ray resolution tests of an off-plane reflection grating for IXO", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 773245 (30 July 2010); https://doi.org/10.1117/12.857503

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