Paper
9 September 2010 Lens solutions which increase manufacturing yield
Stan Szapiel, Catherine Greenhalgh
Author Affiliations +
Proceedings Volume 7652, International Optical Design Conference 2010; 76521L (2010) https://doi.org/10.1117/12.870999
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States
Abstract
The classic method of design centering commonly used to increase the yield of electronic circuits is employed to improve manufacturability of complex lens designs. The approach uses the results of Monte Carlo (MC) statistics to iteratively center the nominal design on a new point that shows an improved yield. Rather than just employing the MC lens run for routine as-built performance forecast, the results of the simulation are re-used to find the changes in the nominal design parameters values which will increase the yield. The centers-of-gravity (COG) algorithm is selected as a quick and easy method of shifting the nominal design point in the multidimensional parameter space to the new location. The classic COG algorithm is modified to avoid situations when the position of either "pass" or "fail" center of gravity is difficult to determine. Examples of application, which include a wide-angle IR lens and a plan-apochromat objective for a digital microscope show that such method of lens design centering is promising, and even a single iteration may result in significantly improved yield.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stan Szapiel and Catherine Greenhalgh "Lens solutions which increase manufacturing yield", Proc. SPIE 7652, International Optical Design Conference 2010, 76521L (9 September 2010); https://doi.org/10.1117/12.870999
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Cited by 1 scholarly publication.
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KEYWORDS
Lens design

Tolerancing

Monte Carlo methods

Yield improvement

Manufacturing

Computer aided design

Wavefronts

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