Paper
25 February 2010 Dark count in single photon avalanche Si detectors
R. Pagano, S. Libertino, G. Valvo, G. Condorelli, B. Carbone, A. Piana, M. Mazzillo, D. N. Sanfilippo, G. G. Fallica, G. Falci, S. Lombardo
Author Affiliations +
Proceedings Volume 7598, Optical Components and Materials VII; 75980Z (2010) https://doi.org/10.1117/12.841996
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
We electrically and optically tested both single pixels and complete arrays of Silicon Photomultipliers, from 5×5 to 64x64, fabricated by STMicroelectronics. Single cell devices operation was studied as a function of the temperature from -25°C to 65°C varying the voltage over breakdown, from 5% up to 20% of the breakdown voltage. Optical characterization was performed using a laser at 659 nm and opportunely chosen filters to vary the optical power. We determined the single pixel gain by using both the time resolved dark count signal and the current under controlled illumination. Typical gain values above 1×105 and above were obtained for operation times of 10 ns, while higher gains are obtained for longer integration times and lower photon flux.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Pagano, S. Libertino, G. Valvo, G. Condorelli, B. Carbone, A. Piana, M. Mazzillo, D. N. Sanfilippo, G. G. Fallica, G. Falci, and S. Lombardo "Dark count in single photon avalanche Si detectors", Proc. SPIE 7598, Optical Components and Materials VII, 75980Z (25 February 2010); https://doi.org/10.1117/12.841996
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Temperature metrology

Data modeling

Diodes

Optical testing

Quenching (fluorescence)

Sensors

RELATED CONTENT

Ultra-compact CMOS single photon detector
Proceedings of SPIE (November 03 2006)
Avalanche photodiode single- and several-photon detection study
Proceedings of SPIE (September 05 2008)
CMOS compatible avalanche photodiode (APD) arrays
Proceedings of SPIE (September 13 1994)
A single photon avalanche detector: SPAD
Proceedings of SPIE (June 12 2007)

Back to Top