Paper
16 February 2010 CMOS modulated light cameras for sensitive surface plasmon resonance imaging
Nicholas S. Johnston, Roger A. Light, Ciaran E. Stewart, Mike G. Somekh, Mark C. Pitter
Author Affiliations +
Proceedings Volume 7577, Plasmonics in Biology and Medicine VII; 75770H (2010) https://doi.org/10.1117/12.843175
Event: SPIE BiOS, 2010, San Francisco, California, United States
Abstract
Complementary metal oxide semiconductor (CMOS) cameras that can measure the phase and amplitude of periodically modulated optical signals have been developed. These allow parallel lock-in imaging at up to 256 x 256 pixels resolution without the need for slow and costly mechanical scanning. In conjunction with a differential surface plasmon resonance (dSPR) system, spatially resolved SPR imaging has been achieved with sensitivities of better than 10 microRIU per pixel per second. Results demonstrating the performance of modulated light cameras for dSPR imaging and high resolution SPR microscopy are presented and discussed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicholas S. Johnston, Roger A. Light, Ciaran E. Stewart, Mike G. Somekh, and Mark C. Pitter "CMOS modulated light cameras for sensitive surface plasmon resonance imaging", Proc. SPIE 7577, Plasmonics in Biology and Medicine VII, 75770H (16 February 2010); https://doi.org/10.1117/12.843175
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KEYWORDS
Cameras

Modulation

Polarizers

Refractive index

Surface plasmons

Capacitance

Demodulation

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