Coherent pupil engineered scanning reflectance confocal microscope (SRCM) for turbid imaging

Christopher Glazowski; James M. Zavislan

doi:10.1117/12.842439

24 February 2010 Coherent pupil engineered scanning reflectance confocal microscope (SRCM) for turbid imaging

Christopher Glazowski, James M. Zavislan

Proceedings Volume 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII; 75700O (2010) https://doi.org/10.1117/12.842439
Event: SPIE BiOS, 2010, San Francisco, California, United States

Abstract

It is well known that use of laser illumination in microscopic imaging can lead to speckle in the resultant images. The influence of speckle artifact is more pronounced particularly when investigating deep regions of biological samples. Furthermore, the regions of turbid media above the focal plane of interest impart statistical modifications to the resulting background and focal signal, which then coherently interfere at the pinhole plane. Through a coherent model of imaging in a scanning reflectance confocal microscope (SRCM) and subsequent experimental evidence, we have shown that engineering the electric field distribution in the system's pupils can be framed in the sense of two-beam-interference of the focal signal and background light. With this model we have theoretically studied the effect of two spatially nonsymmetric electric field distributions and their effect on resultant images for turbid media in a moderately high numerical-aperture (NA = 0.9) SRCM system; these distributions are TEM10 and a novel Nomarski DIC. Signal and background/speckle statistics were parameterized against these pupil distributions and compared to standard TEM00 pupil illumination.

Citation Download Citation

Christopher Glazowski and James M. Zavislan "Coherent pupil engineered scanning reflectance confocal microscope (SRCM) for turbid imaging", Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 75700O (24 February 2010); https://doi.org/10.1117/12.842439

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available