Paper
28 December 2010 Separation of tilt errors from measured data of aspheric surface without datum
Dan Xie, Huadong Yu, Jinkai Xu, Huiling Han, Ying Xu, Tao Liu
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754472 (2010) https://doi.org/10.1117/12.886002
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
As improper installation for aspherical component will inevitably bring the tilt errors to the measured data, the reliability of measured data reduces. Considering that the characteristics of a general elliptic equation include information about direction and location, this paper presents a method based on ellipse fitting to remove tilt errors, which are included in the sampled data of meridian of aspherical component. The experimental results verify the reasonable and correctness of this method. Consequently, this method can effectively isolate the tilt errors from the measured data, simplify the detection method and improve the processing efficiency.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dan Xie, Huadong Yu, Jinkai Xu, Huiling Han, Ying Xu, and Tao Liu "Separation of tilt errors from measured data of aspheric surface without datum", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754472 (28 December 2010); https://doi.org/10.1117/12.886002
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KEYWORDS
Aspheric lenses

Liquid crystals

Surface finishing

Error analysis

Polishing

Data conversion

Optics manufacturing

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