Paper
20 November 2009 Out-of-plane vibration measuring technique based on dynamic AFM
Lin-yan Xu, Long Ma, Xing Fu, Xiao-tang Hu
Author Affiliations +
Proceedings Volume 7510, 2009 International Conference on Optical Instruments and Technology: MEMS/NEMS Technology and Applications; 751004 (2009) https://doi.org/10.1117/12.835939
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China
Abstract
The theory modal of dynamic AFM probe under vibration surface and also the corresponding normalized form are set up, while the frequency range of the out-of-plain vibration of the sample (i.e. the frequency ratio of the sample vibration frequency and the probe's working frequency in the normalized form) that dynamic AFM can measure is the most important to analyzed. Runge-Kutta numerical method is used to analyze the feasibility and the bandwidth of AFM vibration measuring technique. Taking fixed-fixed nanobeam resonator under electrostatic actuation as the measured sample, its out-of-plane amplitude frequency response characteristics are measured using micro-laser Doppler vibrometer (microLD), scanning tapping mode (TM) AFM and force-curve tapping mode (F-TM) AFM respectively. The accordant resonant frequency of 1.73 MHz are gained and the vibration-amplitude test results have small deviations. The frequency speciality of vibration measurement errors of dynamic AFM related with the quality and strength of the vibration sample is strongly put up.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lin-yan Xu, Long Ma, Xing Fu, and Xiao-tang Hu "Out-of-plane vibration measuring technique based on dynamic AFM", Proc. SPIE 7510, 2009 International Conference on Optical Instruments and Technology: MEMS/NEMS Technology and Applications, 751004 (20 November 2009); https://doi.org/10.1117/12.835939
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Atomic force microscopy

Vibrometry

Resonators

Differential equations

Doppler effect

Error analysis

Numerical analysis

Back to Top