The mapping reflected-energy sensor-MaRS: a new level of hyperspectral technology

Christopher Simi; Ernest Reith; Fred Olchowski

doi:10.1117/12.830098

20 August 2009 The mapping reflected-energy sensor-MaRS: a new level of hyperspectral technology

Christopher Simi, Ernest Reith, Fred Olchowski

Proceedings Volume 7457, Imaging Spectrometry XIV; 745703 (2009) https://doi.org/10.1117/12.830098
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

The need to provide high-quality large-area hyperspectral data for land use, geological, environmental, and mapping applications is critical to the US Government in the 21st Century. Technological advances with regard to larger focal plane arrays (FPA) along with maturing spectrometer designs have made it possible for the development of a next generation system beyond AVIRIS. This paper will introduce the MaRS system along with some data examples from Cuprite, NV and the National Arboretum.

Citation Download Citation

Christopher Simi, Ernest Reith, and Fred Olchowski "The mapping reflected-energy sensor-MaRS: a new level of hyperspectral technology", Proc. SPIE 7457, Imaging Spectrometry XIV, 745703 (20 August 2009); https://doi.org/10.1117/12.830098

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available