Paper
17 June 2009 Traceability of the F25 vision system for calibration of grated structures with submicron accuracyv
Ancuta I. Mares, Rob H. Bergmans, Gerard J. W. L Kotte, Rutger R. Tromp
Author Affiliations +
Abstract
We have investigated the uncertainty sources that affect the traceability of dimensional measurements using the VIScan of the Zeiss F25 coordinate measuring machine (CMM). Our experimental results on line-width measurements are promising, having a repeatability below 120 nm and moreover they are reproducible for all light settings investigated. The comparison with the measurements performed on a facility used for line-scale calibrations provides very good agreement. At present we can report an uncertainty below 0.45 μm for line-width calibrations. This would be the first traceable F25 VIScan, and to our knowledge one of the first truly traceable vision systems for line-width calibrations.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ancuta I. Mares, Rob H. Bergmans, Gerard J. W. L Kotte, and Rutger R. Tromp "Traceability of the F25 vision system for calibration of grated structures with submicron accuracyv", Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739004 (17 June 2009); https://doi.org/10.1117/12.827545
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

CCD cameras

Opacity

Cameras

Edge detection

Optical testing

Charge-coupled devices

Back to Top