Paper
17 June 2009 Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometry
Cheng-Chih Hsu, Ju-Yi Lee, Chyan-Chyi Wu
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Abstract
A novel laser encoder is presented for sub-nanometer displacement measurement. It is based on optical heterodyne interferometry and two arms of compensation optics with a symmetric and quasi-common-path optical configuration in polarization space. High stability and resolution can be achieved for displacement measurements. The theoretical analysis shows that our method can effectively compensate misalignments resulting from the dynamic runout in laser encoders. Experimental results reveal that the laser encoder can measure a displacement in subnanometer scale and in millimeter travel range.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cheng-Chih Hsu, Ju-Yi Lee, and Chyan-Chyi Wu "Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometry", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891M (17 June 2009); https://doi.org/10.1117/12.827453
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Computer programming

Heterodyning

Diffraction gratings

Interferometry

Error analysis

Interferometers

Polarization

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