Aspects of speckle contrast metrology

L. Tchvialeva; I. Markhvida; T. K. Lee

doi:10.1117/12.870674

13 September 2010 Aspects of speckle contrast metrology

L. Tchvialeva, I. Markhvida, T. K. Lee

Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73871U (2010) https://doi.org/10.1117/12.870674
Event: Speckle 2010, 2010, Florianapolis, Brazil

Abstract

Recent revitalization of interests in applying speckle techniques gives rise to the concern of measurement accuracy. In particular, speckle contrast, an important metric in numerous optical techniques, is affected by many factors related to light sources, propagation media, and receivers. As a result, proper experimental design is required to minimize measurement errors. This article considers errors introduced by the discrepancy of incidence and observation angles, by the limited number of available speckles, and by intensity saturation.

Citation Download Citation

L. Tchvialeva, I. Markhvida, and T. K. Lee "Aspects of speckle contrast metrology", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73871U (13 September 2010); https://doi.org/10.1117/12.870674

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available