High speed imaging with CW THz for security

Qian Song; Albert Redo-Sanchez; Yuejin Zhao; Cunlin Zhang

doi:10.1117/12.807197

2 February 2009 High speed imaging with CW THz for security

Qian Song, Albert Redo-Sanchez, Yuejin Zhao, Cunlin Zhang

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 716016 (2009) https://doi.org/10.1117/12.807197
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

Continuous THz wave (CW THz) has been widely used in imaging field. But for security screening such as inspection at the airport, the speed of the imaging calls for an improvement since the former CW image systems which scan point to point could not satisfy. To increase the image speed, we proposed a fast CW THz image system in which a galvanometer is introduced for the first time. The galvanometer makes the coming beam reflected in different angles by vibrating at a certain frequency which can significantly decrease the image acquisition time compare to point scan THz imaging. A big hyperbolic polyethylene lens is also used in the system to collect all the beams on to the target. A Gunn oscillator and a corresponding Schottky diode are the source and detector respectively. The image we get has ideal resolution. And after image processing, the images looked not only clear but also realistic. The system has more practicality because it is designed in reflection geometry instead of transmission geometry. Moreover, the source and detector in our system do not as ponderous as gas laser which has been used in many THz imaging system previously. Example of measurements of weapons concealed behind the cloth and box are presented and discussed. A compact high speed THz imaging system is expectable which will have a widely application in security field.

Citation Download Citation

Qian Song, Albert Redo-Sanchez, Yuejin Zhao, and Cunlin Zhang "High speed imaging with CW THz for security", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716016 (2 February 2009); https://doi.org/10.1117/12.807197

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available