Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

Pavel Skarvada; Lubomír Grmela; Inas Faisel Abuetwirat; Pavel Tománek

doi:10.1117/12.818080

18 November 2008 Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

Pavel Skarvada, Lubomír Grmela, Inas Faisel Abuetwirat, Pavel Tománek

Proceedings Volume 7138, Photonics, Devices, and Systems IV; 713829 (2008) https://doi.org/10.1117/12.818080
Event: Photonics, Devices, and Systems IV, 2008, Prague, Czech Republic

Abstract

This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection. The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.

Citation Download Citation

Pavel Skarvada, Lubomír Grmela, Inas Faisel Abuetwirat, and Pavel Tománek "Nanooptics of locally induced photocurrent in monocrystalline Si solar cells", Proc. SPIE 7138, Photonics, Devices, and Systems IV, 713829 (18 November 2008); https://doi.org/10.1117/12.818080

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