PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Dynamics information of nematic liquid crystal (NLC) in In-Plane-Switching (IPS) mode is attractive and important
for applications of high vision angle techniques. In this paper, we used a novel evaluation method to detect the molecular
orientation dynamics of NLC thin film in depth direction from its birefringence responses using birefringence scanning
near-field optical microscopy (Bi-SNOM). In this method, a Bi-SNOM probe is inserted into IPS mode NLC thin film, in
which the time responses of LC molecules at different position in depth are also measured. In addition, Molecular
orientation hysteresis to the applied voltage is observed. We measured the orientation hysteresis of LC molecules at
different position along the depth direction in the LC thin film. Experimental results show that the proposed method is
effective and feasible for its consistence with original specialities.
Jing Qin andNorihiro Umeda
"Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333D (12 January 2009); https://doi.org/10.1117/12.807778
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Jing Qin, Norihiro Umeda, "Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM," Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333D (12 January 2009); https://doi.org/10.1117/12.807778