Polarization sensitivity analysis of reflective optical systems

Ying Zhang; Huijie Zhao; Haibo Zhao

doi:10.1117/12.807361

13 October 2008 Polarization sensitivity analysis of reflective optical systems

Ying Zhang, Huijie Zhao, Haibo Zhao

Proceedings Volume 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration; 71290R (2008) https://doi.org/10.1117/12.807361
Event: Seventh International Symposium on Instrumentation and Control Technology, 2008, Beijing, China

Abstract

Reflective optical systems are used widely in space optics and polarization sensitivity is one of the important factors to describe the polarization properties of the light passing through optical systems. In this paper, a unified discussion of the polarization sensitivity theory is presented and the method of using polarization ray tracing is used to analyze the polarization sensitivity caused by the reflectors in reflective optical systems. The Mueller calculus used in polarization ray tracing is studied to calculate the linear polarization sensitivity LPS in reflective optical systems. The changed rules of the polarization sensitivity are also studied. A Ritchey-Chretien system is presented as an example system to be analyzed. According to the results of the polarization analysis, it is proved that the change of the polarization sensitivity is serious in the reflective optical systems those have high numerical aperture, large incident angles or work in wide wavelength.

Citation Download Citation

Ying Zhang, Huijie Zhao, and Haibo Zhao "Polarization sensitivity analysis of reflective optical systems", Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 71290R (13 October 2008); https://doi.org/10.1117/12.807361

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