Paper
4 September 2008 An application of carbon nanotubes for integrated circuit interconnects
J. C. Coiffic, L. E. Foa Torres, H. Le Poche, M. Fayolle, S. Roche, S. Maitrejean, S. Roualdes, A. Ayral
Author Affiliations +
Abstract
Integrated circuits fabrication is soon reaching strong limitations. Help could come from using carbon nanotubes as conducting wires for interconnects. Although this solution was proposed six years ago, researchers still come up with many obstacles such as localization, low temperature growth on copper, contacting and reproducibility. The integration processes exposed here intend to meet the industrial requirements. Two approaches are then possibly followed. Either using densely packed single wall (SWCNT) (or very tiny multiwall) nanotubes, or filling up the whole interconnect diameter with a single large multiwall (MWCNT) nanotube. In this work, we focus on the integration of multiwall vertical interconnects. Densely packed MWCNTs are grown in via holes by CVD. Alternatively, we have developed a method to obtain a single large nanofibre grown by PECVD (MWCNF) in each via hole. Electrical measurements are performed on CVD and PECVD grown carbon nanotubes. The role of electron-phonon interaction in these devices is also briefly discussed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. C. Coiffic, L. E. Foa Torres, H. Le Poche, M. Fayolle, S. Roche, S. Maitrejean, S. Roualdes, and A. Ayral "An application of carbon nanotubes for integrated circuit interconnects", Proc. SPIE 7037, Carbon Nanotubes and Associated Devices, 70370D (4 September 2008); https://doi.org/10.1117/12.799100
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Cited by 3 scholarly publications.
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KEYWORDS
Carbon nanotubes

Copper

Semiconducting wafers

Chemical vapor deposition

Integrated circuits

Plasma enhanced chemical vapor deposition

Resistance

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